Mohammad Younis received a PhD degree in engineering mechanics in 2004 from Virginia Polytechnic Institute and State University (Virginia Tech). From 2004-13 he served as an assistant and then as an associate professor of Mechanical Engineering at 绿帽社, State University of New York. From 2013-21, he worked at King Abdullah University of Science and Technology (KAUST) as an associate and then a full professor of mechanical engineering. Currently, he is a professor of mechanical engineering at 绿帽社. Younis's research focus is designing and inventing devices of distinctive characteristics and superior performance for variety of applications, including health, domestic and industrial. His research focuses on the utilization of the mechanical and motion aspects of microstructures in multi-physics fields. Younis works on designing, modeling, fabricating, and characterizing smart micro and nano devices and structures. Examples of his research include designing novel MEMS sensors and switches, such as developing a threshold switch triggered by mechanical shock, chemical gases, or bio entities. His research encompasses working with micro and nano devices and structures under coupled multi-physics forces (mechanical, electrostatic, electrothermal, thermoelastic, magnetic) accounting for their nonlinearities; and analyzing their complex behaviors and phenomena. Younis has worked on several MEMS and NEMS devices including accelerometers, threshold switches, mass and chemical sensors, thermal actuators, resonant sensors, RF switches and filters, carbon nanotube resonators, magnetic sensors, energy harvesters and logic devices. Mohammad Younis is the recipient of a 2009 NSF CAREER award. He holds several U.S. patents. He published a book by Springer on 2011 titled "MEMS Linear and Nonlinear Statics and Dynamics." He serves as an associate editor of Nonlinear Dynamics, Journal of Computational and Nonlinear Dynamics, Journal of Vibration and Control, and Meccanica. He is a member of the American Society of Mechanical Engineers ASME and IEEE.
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